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Concurrent Edge and Corner Detection

Biomedical Sciences Research Institute Computer Science Research Institute Environmental Sciences Research Institute Nanotechnology & Advanced Materials Research Institute

Coleman, SA, Kerr, D and Scotney, BW (2007) Concurrent Edge and Corner Detection. In: IEEE International Conference on Image Processing (ICIP 2007), San Antonio, Texas. IEEE Signal Processing Society. 4 pp. [Conference contribution]

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DOI: 10.1109/ICIP.2007.4379818

Abstract

To enable fast reliable feature matching or tracking in scenes, features need to be discrete and meaningful, and hence corner detection is often used for this purpose. However, to obtain a higher level description of an image, such as identification of objects, additional information such as edges is required, and more recently detectors have been proposed that find both edges and corners. We present a combined operator, enabling edge and corner detection to be achieved concurrently. We demonstrate that accuracy is comparable to well-known existing corner detectors and edge detectors, and, as standard post-smoothing of the corner map is not required, significantly reduced computation time can be achieved.

Item Type:Conference contribution (Paper)
Keywords:corner detection , edge detection , feature matching
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Computing and Information Engineering
Faculty of Computing & Engineering > School of Computing and Intelligent Systems
Research Institutes and Groups:Computer Science Research Institute
Computer Science Research Institute > Information and Communication Engineering
Computer Science Research Institute > Intelligent Systems Research Centre
ID Code:6847
Deposited By:Professor Bryan Scotney
Deposited On:23 May 2011 15:46
Last Modified:07 Nov 2011 16:53

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