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Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

Biomedical Sciences Research Institute Computer Science Research Institute Environmental Sciences Research Institute Nanotechnology & Advanced Materials Research Institute

Roy, SS, McCann, R, Papakonstantinou, P, McLaughlin, JAD, Kirkman, IW, Bhattacharya, Basab and Silva, SRP (2006) Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films. JOURNAL OF APPLIED PHYSICS, 99 (4). 043511-043515. [Journal article]

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URL: http://scitation.aip.org/getpdf/servlet/GetPDFServlet?filetype=pdf&id=JAPIAU000099000004043511000001&idtype=cvips&prog=normal

DOI: 10.1063.1.2173046

Abstract

Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.

Item Type:Journal article
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:279
Deposited By:Mrs Ann Blair
Deposited On:21 Oct 2009 15:38
Last Modified:15 Jun 2011 10:51

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