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Intrinsic stress measured on ultra-thin amorphous carbon films deposited on AFM cantilevers

Biomedical Sciences Research Institute Computer Science Research Institute Environmental Sciences Research Institute Nanotechnology & Advanced Materials Research Institute

Lemoine, P, Zhao, JF, Bell, A, Maguire, PD and McLaughlin, JAD (2001) Intrinsic stress measured on ultra-thin amorphous carbon films deposited on AFM cantilevers. Diamond and Related Materials, 10 (1). pp. 94-98. [Journal article]

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URL: http://dx.doi.org/10.1016/S0925-9635(00)00455-6

DOI: doi:10.1016/S0925-9635(00)00455-6

Abstract

Ultra-thin amorphous carbon films were deposited onto atomic force cantilevers by plasma enhanced chemical vapour deposition. High magnification scanning electron micrographs at 30 kV reveal that the AFM tip is not affected by the deposition but its radius is broadened by the presence of the coating. Energy dispersive X-ray analysis at 4 kV shows that the film mostly coats one side of the lever, resulting in a bending of the cantilever, readily observable by scanning electron microscopy. This deformation is elastic and is caused by an internal compressive stress of 2.60 and 2.54 GPa, respectively, for 20-nm and 110-nm-thick films. After 15 at.% Si incorporation, these stresses are reduced to 0.97 and 0.78 GPa. It is believed that the increased hydrogenation upon silicon addition causes a loosening of the carbon network structure and is, therefore, responsible for the observed stress relief.Copyright © 2001 Elsevier Science B.V. All rights reserved.

Item Type:Journal article
Keywords:Amorphous carbon; AFM cantilever; Compressive stresses; Ultra-thin films
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:2097
Deposited By:Mrs Ann Blair
Deposited On:27 Nov 2009 13:46
Last Modified:24 Feb 2014 10:10

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