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Golan, G, Rabinovich, E, Inberg, A, Axelevitch, A, Lubarsky, G, Rancoita, P, Demarchi, M, Seidman, A and Croitoru, N (2001) Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors. Microelectronics Reliability, 41 (1). p. 67. [Journal article]
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URL: http://dx.doi.org/10.1016/S0026-2714(00)00212-2
DOI: doi:10.1016/S0026-2714(00)00212-2
| Item Type: | Journal article |
|---|---|
| Faculties and Schools: | Faculty of Computing & Engineering Faculty of Computing & Engineering > School of Engineering |
| Research Institutes and Groups: | Engineering Research Institute Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC) |
| ID Code: | 19778 |
| Deposited By: | Dr Gennady Lubarsky |
| Deposited On: | 06 Sep 2011 15:47 |
| Last Modified: | 06 Sep 2011 15:47 |
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