Ruzin, A, Croitoru, N, Lubarsky, G and Rosenwaks, Y (2001) Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 461 (1-3). p. 229. [Journal article]
Full text not available from this repository.
URL: http://dx.doi.org/10.1016/S0168-9002(00)01216-X
DOI: doi:10.1016/S0168-9002(00)01216-X
| Item Type: | Journal article |
|---|---|
| Faculties and Schools: | Faculty of Computing & Engineering Faculty of Computing & Engineering > School of Engineering |
| Research Institutes and Groups: | Engineering Research Institute Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC) |
| ID Code: | 19777 |
| Deposited By: | Dr Gennady Lubarsky |
| Deposited On: | 06 Sep 2011 15:44 |
| Last Modified: | 06 Sep 2011 15:44 |
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