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Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy

Biomedical Sciences Research Institute Computer Science Research Institute Environmental Sciences Research Institute Nanotechnology & Advanced Materials Research Institute

Ruzin, A, Croitoru, N, Lubarsky, G and Rosenwaks, Y (2001) Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy. Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 461 (1-3). p. 229. [Journal article]

Full text not available from this repository.

URL: http://dx.doi.org/10.1016/S0168-9002(00)01216-X

DOI: doi:10.1016/S0168-9002(00)01216-X


Item Type:Journal article
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:19777
Deposited By:Dr Gennady Lubarsky
Deposited On:06 Sep 2011 15:44
Last Modified:06 Sep 2011 15:44

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