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Nanomechanical measurements on polymers using contact mode atomic force microscopy

Biomedical Sciences Research Institute Computer Science Research Institute Environmental Sciences Research Institute Nanotechnology & Advanced Materials Research Institute

Lemoine, P and McLaughlin, JAD (1999) Nanomechanical measurements on polymers using contact mode atomic force microscopy. THIN SOLID FILMS, 339 (1-2). pp. 258-264. [Journal article]

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Abstract

Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

Item Type:Journal article
Keywords:atomic force microscopy; hardness; polymers; surface morphology
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:18920
Deposited By:Mrs Ann Blair
Deposited On:19 Jul 2011 08:57
Last Modified:19 Jul 2011 08:57

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