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Lemoine, P and McLaughlin, JAD (1999) Nanomechanical measurements on polymers using contact mode atomic force microscopy. THIN SOLID FILMS, 339 (1-2). pp. 258-264. [Journal article]
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Abstract
Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
| Item Type: | Journal article |
|---|---|
| Keywords: | atomic force microscopy; hardness; polymers; surface morphology |
| Faculties and Schools: | Faculty of Computing & Engineering Faculty of Computing & Engineering > School of Engineering |
| Research Institutes and Groups: | Engineering Research Institute Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC) |
| ID Code: | 18920 |
| Deposited By: | Mrs Ann Blair |
| Deposited On: | 19 Jul 2011 08:57 |
| Last Modified: | 19 Jul 2011 08:57 |
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