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Bonding configurations in DBOP-FCVA nitrogenated tetrahedral amorphous carbon films studied by Raman and X-ray photoelectron spectroscopies

Biomedical Sciences Research Institute Computer Science Research Institute Environmental Sciences Research Institute Nanotechnology & Advanced Materials Research Institute

Roy, SS, Papakonstantinou, P, Abbas, GA, McCann, R, Quinn, JP and McLaughlin, JAD (2004) Bonding configurations in DBOP-FCVA nitrogenated tetrahedral amorphous carbon films studied by Raman and X-ray photoelectron spectroscopies. Diamond and Related Materials, 13 (4-8). pp. 1459-1463. [Journal article]

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URL: http://dx.doi.org/10.1016/j.diamond.2003.11.085

DOI: doi:10.1016/j.diamond.2003.11.085

Abstract

Nitrogenated tetrahedral amorphous carbon (ta-C:N) films having nitrogen content from 0 to 10.3 at.%, have been produced by a double bend off-plane filtered cathodic vacuum arc system. X-ray photoelectron and Raman spectroscopies have been applied to study the effect of nitrogen in the bonding structure in the films. Deconvolution of the XPS spectra revealed a decrease in the amount of sp3-bonded carbon in the ta-C:N films. A comparative study between the Raman parameters at 514 and at 633 nm excitation wavelength was presented. Nitrogen (N) incorporation led to a lower G peak position and higher ID/IG ratios, indicating the development of larger sp2 domains. Q (−ve) parameter (which measures the skewness of G line) increased sharply with the increased of N content in the films. The hardness of the films was evaluated by nanoindentation.Copyright Elsevier 2004

Item Type:Journal article
Keywords:Amorphous carbon nitride; XPS; Raman; Nanoindentation
Faculties and Schools:Faculty of Computing & Engineering
Faculty of Computing & Engineering > School of Engineering
Research Institutes and Groups:Engineering Research Institute
Engineering Research Institute > Nanotechnology & Integrated BioEngineering Centre (NIBEC)
ID Code:1252
Deposited By:Mrs Ann Blair
Deposited On:27 Nov 2009 13:51
Last Modified:21 Feb 2014 15:28

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